Cameca LEAP 4000 HR Atom Probe

State-of-the-art atomic-scale analysis capabilities for Deakin.

JEOL JEM 2100 LaB6 TEM

JEOL JEM 2100 LaB₆ TEM

The JEOL JEM-2100 is a high-performance Transmission Electron Microscope (TEM) with a Lanthanum Hexaboride (LaB₆) electron source for analyses at the atomic/molecule level in materials science, nanotechnology and life science.

Features

High resolution imaging with specialist characterization capabilities of EDS, and Tomography.

Specifications

200kV TEM HR version with LaB₆ source
Spot Diameter
TEM mode: 20 to 200nm
EDS, NBD and CBD mode: 1.0 to 25nm
Magnification Range
LOW MAG mode: 50x to 6,000x
MAG mode: 2000x to 1,500,000x
Resolution
Point: 0.23nm
Lattice 0.14nm
Image capture
GATAN Orius SC1000 camera: Progressive interline device, Sensor area 36x24mm, 4008x2672 pixels (9μm ea)
BF and HAADF STEM detectors

Additional Characterization Capabilities

JEOL JD2300 Energy Dispersive X-Ray Analyser, Si(Li) detector, ultrathin window, 0.13 sr, B-U
JEOL Electron Tomography
GATAN in-situ straining/heating stage

Instrument Output Examples

Bright-field diffraction contrast image of crystal stacking faults in a magnesium alloy Dark-field image of a magnesium alloy Selected area diffraction image of different crystals within the sample

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23rd January 2014