Cameca LEAP 4000 HR Atom Probe

State-of-the-art atomic-scale analysis capabilities for Deakin.

JEOL JEM 2100F FEG TEM

JEOL JEM 2100F FEG TEM

The JEOL JEM-2100F is a high-performance Transmission Electron Microscope (TEM) with a field emission electron source for analyses at the atomic/molecule level in materials science, nanotechnology and life science.

Features

High resolution imaging with specialist characterization capabilities of EDS, EFTEM and EELS, and ACOM.

Specifications

200kV TEM HR version with ZrO/W (100) field emission source
Magnification Range
LOW MAG mode: 50x to 6,000x
MAG mode: 2000x to 1,500,000x
Spot Diameter
TEM mode: 2-5nm
EDS, NBD & CBD mode: 0.5 to 2.4nm
Resolution
Point: 0.23nm
Lattice 0.1nm
Image capture
GATAN Orius SC1000 camera: Progressive interline device, Sensor area 36x24mm, 4008x2672 pixels (9μm ea)
BF and HAADF STEM detectors

Additional Characterization Capabilities

JEOL JED-2300T Energy Dispersive X-Ray Analyser, Dry SD30GV Detector: 133eV, 30mm2 0.26 sr, B-U
GATAN GIF Quantum 965 Post column energy filter and EELS spectrometer. Energy resolution 0.10 eV FWHM
NanoMEGAS ASTAR Automated Crystal Orientation and phase mapping package for TEM
GATAN 648 Vacuum Transfer Holder

Deakin University acknowledges the traditional land owners of present campus sites.

23rd January 2014