Cameca LEAP 4000 HR Atom Probe

State-of-the-art atomic-scale analysis capabilities for Deakin.

Leo 1530 FEG SEM

Leo 1530 FEG SEM

The LEO 1530 is a high resolution scanning electron microscope (SEM) that uses a Schottky-type field-emission electron source. A beam booster is used to optimise electron optical performance at all accelerating voltages. In addition, the optical column has no crossovers and utilises a magnetic/electrostatic objective lens to minimise beam imperfections at low voltage by reducing chromatic aberration.

Specifications

Resolution
1 kV / 3 nm, 20 kV / 1 nm
Magnification
20X to 900,000X
Accelerating Voltage
200 V to 30 kV
Probe Current
4 pA to 10 nA
Electron Gun
Thermal field emission type
Specimen Stage
x=75mm, y=75mm, z=25mm (all motorized)
Working distance 2mm - 45mm+
Detectors
High efficiency In-lens secondary electron detector
Everhart-Thornley Secondary Electron Detector
Backscattered electron detector (Rutherford Type)
Electron Backscatter Diffraction (EBSD) detector - Oxford (HKL) Nordlys S with high resolution CCD for high angular resolution
Image Processing
Seven integration and averaging modes
Image Store Resolution
512 x 384 → 3072 x 2304 pixel
Thermal tension-compression stage
800°C + 5kN & 1kN load cells
Tilt option for combined EBSD mapping

Instrument Output Examples

Magnesium heated at 281C for 1000 seconds Insitu Heating/Deformation Stage Precipitate in Magnesium

Deakin University acknowledges the traditional land owners of present campus sites.

23rd January 2014