Cameca LEAP 4000 HR Atom Probe

State-of-the-art atomic-scale analysis capabilities for Deakin.

What we do

The Deakin Electron Microscope Facility services research interests throughout Deakin University. Facility staff are responsible for:

  1. developing, operating, and maintaining instrumentation and capabilities and;
  2. training and/or collaborating with users on specific instruments.

Staff members provide an advanced level of expertise in the particular type of characterisation technique being utilised.

Capabilities/Specialist Services

  • Electron Backscatter Diffraction (EBSD) for Field Emission Gun (FEG) Scanning Electron Microscopes (SEM): 2D fast acquisition (HKL Nordlys F) with integrated Energy Dispersive X-Ray (EDX) for phase ID + 2D high angular resolution (HKL Nordlys S) + 3D automated serial section in Focused Ion Beam (FIB) (TSL Hikari) with integrated EDX for phase ID
  • Automated Crystal Orientation Mapping (ACOM) for FEG Transmission Electron Microscopes (TEM): Precessed or non-precessed acquisition and ID of crystal lattice diffraction patterns to determine submicron crystal orientations
  • High resolution crystal strain mapping (Crosscourt software)

Support Infrastructure

The centre houses a comprehensive collection of equipment supporting electron microscopy including:

  • Ion polisher (Gatan PIPS)
  • Vacuum storage (various)
  • Critical point dryer (Leica CPD300 - fully automated, 6cm diameter chamber)
  • Conventional and vacuum furnaces
  • Electro-polishing units
  • Chemical etching facilities

There is currently one casual staff member providing limited technical support (up to 10 hours per week). All other technical support and infrastructure issues are handled by the relevant area managers.

  1. Introduction to Electron Microscopy
  2. Scanning Electron Microscopes (SEM
  3. Transmission Electron Microscopes (TEM)

Deakin University acknowledges the traditional land owners of present campus sites.

23rd January 2014