Cameca LEAP 4000 HR Atom Probe
State-of-the-art atomic-scale analysis capabilities for Deakin.
- About us
- Our team
- What we do
- Introduction to Electron Microscopy
- Scanning Electron Microscopes (SEM)
- Transmission Electron Microscopes (TEM)
- Atom Probe Tomography (APT)
- Our Instruments
- FEI Quanta 3D FEG FIB-SEM
- Zeiss Supra 55VP FEG SEM
- Leo 1530 FEG SEM
- JEOL JEM 2100 LaB₆ TEM
- JEOL JEM 2100F FEG TEM
- Cameca LEAP 4000 HR Atom Probe
- JEOL JSM 7800F FEG SEM
+61 5227 3468
Deakin Electron Microscopy
Institute for Frontier Materials
Geelong Technology Precinct
75 Pigdons Road
Waurn Ponds Victoria 3216
Introduction to Electron Microscopy
Scanning Electron Microscopes (SEMs) and Transmission Electron Microscopes (TEMs) differ from conventional light microscopes in that they employ electrons rather than photons to irradiate material and produce images.
What can the instruments do for us?
They allow us to see things at the micro, nano and sub-nanometre scales.
The material being studied should be a solid material and be able to withstand the energy of the electrons being directed at it.
Electron microscopes can analyse most materials, including:
- Metals and metal compounds
- Rocks and minerals
- Plant and animal materials
- Some liquids
Deakin University CRICOS Provider Code: 00113B