• Labs and Equipment
• Equipment
• Laboratories

Electron Microscope Facility

Scanning Electron Microscopes

The scanning electron microscopes in this facility are used to investigate surface morphology, crystalline properties (type and orientation) and composition in solid materials.

Imaging in an SEM requires an energized beam of electrons directed at a piece of material so that they interact with a thin surface layer of material. This interaction produces different types of emissions, some of which are captured by detectors and converted into images.

The types of detectors used in these SEMs

• Back Scattered Electron imaging [BSE]
• Back Scattered Electron imaging [BSE]
• ACSecondary Electron imaging [SE]
• Energy Dispersive X-ray analysis [EDX]
• Electron Back Scatter Diffraction [EBSD]

The material for analysis must be at least partially conductive. Non-conducting materials can be coated with a thin layer of gold or carbon to enable analysis.

• Leica S440 tungsten filament
• Leo 1530 field emission gun

Transmission Electron Microscope

Imaging in a TEM requires the transmission of an energized beam of electrons through a thin piece of material so that they interact with the material as they pass through. This interaction produces different types of emissions, some of which are captured by detectors and converted into images.

• JEOL JEM-2100 (HR)