TEM - JEOL JEM-2100 (HR)
Make:
Jeol
Specifications:
- LaB6 filament
- Resolution: 0.1 -0.2nm
- e-beam voltage: 100kV - 200kV
- Energy Dispersive X-ray analysis [EDX]
- High resolution (11 Mpixel) digital image acquisition
- In-situ thermal tension-compression stage
Sample Preparation
TEM sample preparation guide - 1.2MB ppt
- Lobotom/Acutom: coarse sectioning
- Leica UC6 ultramicrotome: nanometre dimension sectioning
- Struers Tenupol-5 electrolytic jet polisher: thinning of conductive materials
- Ion miller: ablative thinning and polishing of solid state materials
