There are three different microscopes available – covering the scale of magnification from macro to nano.
Scanning Electron Microscopy
Must be completed at least 24 hours prior to microscopic analysis and kept in the desiccator cabinet in KE2.103.02 until analysis.
Always wear gloves! The SEM is extremely sensitive to contamination. Gloves must be worn when touching your sample, sample holder, placing the sample holder into the instrument chamber, or cleaning the chamber seal.
At any magnification, the beam size must be reasonably well-matched to the size of the pixel – otherwise a loss in sharpness or production of artefacts of the image results due to oversampling or under-sampling.
Beam current is proportional to the probe diameter. The probe diameter must be smaller than the size of the features to imaged.