There are three different microscopes available in the lab which cover the scale of magnification from macro to nano.

Olympus SZ61 TR Macroscope

Equipment Olympus SZ61 TR Macroscope
Magnification X0.67X – X4.5

Working Distance = 110mm

Tube Tilting Angle = 45°

Eyepieces = WHSZ10X-H FN 22*

*Please see Instructional Manual for more details

Location KE2.101
Booking address *G SEBE ENG Lab Eqpmt KE2.101 Macro-scope

Olympus SZ61 Macroscope SOP (PDF, 139.5KB)

Instruction manuals

Olympus SZ61 Macroscope (PDF, 692.6KB)

Olympus GX41 Inverted Microscope

Equipment Olympus GX41 Inverted Microscope
MagnificationX50, X100, X200, X1000

Working distance = dependant on objective in use*

Observation tubes = U-CTR30-2*

Objectives = MPLN X5, X10, X20, X100*

Eyepieces = WHB10X FN 20*

*Please see Instructional Manual for more details

Booking address*G SEBE ENG Lab Eqpmt KE2.101 Optical Microscope

Olympus GX41 Inverted Optical Microscope SOP (PDF, 156.7KB)

Instruction manuals

Olympus GX41 Inverted Optical Microscope (PDF, 1.3MB)

Resources and information

Depth of focus (mm), field of view (mm) and working distance (mm) decreases with increase in magnification.

Resolution (mm) increases with increase in magnification.


Equipment JEOL JSM-IT300
MagnificationX5 to X300,000

Imaging modes = Secondary electron image,
Composition image, Topographic image

Resolution High vacuum mode - 3.0 nm (30 kV), 15.0 nm (1.0 kV)

Resolution Low vacuum mode - 4.0 nm (30 kV BED)

Acceleration voltage = 0.3kV – 30kV

Probe current = 1pA - 1mA

Low vacuum pressure setting range = 10 – 650 Pa

Maximum Specimen = 200mm diameter, 80mm height (WD = 10mm)

Image format = BMP, TIFF, JPEG



Swipe Access through technician only

Booking address

*G SEBE ENG Lab Eqpmt KE2.103.02 SEM

All Bookings must be booked with a technician



Instruction manualsAvailable in the SEM Lab
Resources and information

Sample Preparation - Must be completed at least 24 hours prior to microscopic analysis and kept in the desiccator cabinet in KE2.103.02 until analysis.

Always wear gloves! The SEM is extremely sensitive to contamination. Gloves must be worn when touching your sample, sample holder, placing the sample holder into the instrument chamber, or cleaning the chamber seal.

Resolution at any magnification, the beam size must be reasonably well-matched to the size of the pixel – otherwise a loss in sharpness or production of artefacts of the image results due to oversampling or under-sampling. Beam current is proportional to the probe diameter. The probe diameter must be smaller than the size of the features to imaged.

Last updated:
Page custodian: Faculty of Science, Engineering & Built Environment