Microscopy
Microscopy
There are three different microscopes available in the lab which cover the scale of magnification from macro to nano.
| Equipment | Olympus SZ61 TR Macroscope |
|---|---|
| Magnification | X0.67X – X4.5 |
| Specifications | Working distance = 110mm Tube tilting angle = 45° Eyepieces = WHSZ10X-H FN 22* *Please see instructional manual for more details |
| Location | KE2.101 |
| Booking address | *G SEBE ENG Lab Eqpmt KE2.101 Macro-scope |
| SOP | |
| Instruction manuals |
| Equipment | Olympus GX41 Inverted Microscope |
|---|---|
| Magnification | X50, X100, X200, X1000 |
| Specifications | Working distance = dependant on objective in use* Observation tubes = U-CTR30-2* Objectives = MPLN X5, X10, X20, X100* Eyepieces = WHB10X FN 20* *Please see instructional manual for more details |
| Location | KE2.101 |
| Booking address | *G SEBE ENG Lab Eqpmt KE2.101 Optical Microscope |
| SOP | |
| Instruction manuals | |
| Resources and information | Depth of focus (mm), field of view (mm) and working distance (mm) decreases with increase in magnification. Resolution (mm) increases with increase in magnification. |
| Equipment | JEOL JSM-IT300 |
|---|---|
| Magnification | X5 to X300,000 |
| Specifications | Imaging modes = Secondary electron image, Resolution high vacuum mode - 3.0 nm (30 kV), 15.0 nm (1.0 kV) Resolution low vacuum mode - 4.0 nm (30 kV BED) Acceleration voltage = 0.3kV – 30kV Probe current = 1pA - 1mA Low vacuum pressure setting range = 10 – 650 Pa Maximum specimen = 200mm diameter, 80mm height (WD = 10mm) Image format = BMP, TIFF, JPEG |
| Location | KE2.103.02 Swipe access through technician only. |
| Booking address | *G SEBE ENG Lab Eqpmt KE2.103.02 SEM All bookings must be made with a technician. |
| SOP | |
| Instruction manuals | Available in the SEM Lab |
| Resources and information |
Important notesSample preparation must be completed at least 24 hours prior to microscopic analysis and kept in the desiccator cabinet in KE2.103.02 until analysis. Always wear gloves! The SEM is extremely sensitive to contamination. Gloves must be worn when touching your sample, sample holder, placing the sample holder into the instrument chamber, or cleaning the chamber seal. Resolution at any magnification, the beam size must be reasonably well-matched to the size of the pixel – otherwise a loss in sharpness or production of artefacts of the image results due to oversampling or under-sampling. Beam current is proportional to the probe diameter. The probe diameter must be smaller than the size of the features to imaged. |