Microscopy

Working distance = 110mm

Tube tilting angle = 45°

Eyepieces = WHSZ10X-H FN 22*

*Please see instructional manual for more details

Olympus SZ61 Macroscope SOP (PDF, 139.5KB)

Olympus SZ61 Macroscope (PDF, 692.6KB)

Working distance = dependant on objective in use*

Observation tubes = U-CTR30-2*

Objectives = MPLN X5, X10, X20, X100*

Eyepieces = WHB10X FN 20*

*Please see instructional manual for more details

Olympus GX41 Inverted Optical Microscope SOP (PDF, 156.7KB)

Olympus GX41 Inverted Optical Microscope (PDF, 1.3MB)

Depth of focus (mm), field of view (mm) and working distance (mm) decreases with increase in magnification.

Resolution (mm) increases with increase in magnification.

Imaging modes = Secondary electron image,
Composition image, topographic image

Resolution high vacuum mode - 3.0 nm (30 kV), 15.0 nm (1.0 kV)

Resolution low vacuum mode - 4.0 nm (30 kV BED)

Acceleration voltage = 0.3kV – 30kV

Probe current = 1pA - 1mA

Low vacuum pressure setting range = 10 – 650 Pa

Maximum specimen = 200mm diameter, 80mm height (WD = 10mm)

Image format = BMP, TIFF, JPEG

KE2.103.02

Swipe access through technician only.

*G SEBE ENG Lab Eqpmt KE2.103.02 SEM

All bookings must be made with a technician.

JEOL SEM IT300 SOP (PDF, 278.1KB)

• A Guide to Scanning Microscope Observation
• Energy table for EDS Analysis
• Product details
• JEOL Resources

Important notes

Sample preparation must be completed at least 24 hours prior to microscopic analysis and kept in the desiccator cabinet in KE2.103.02 until analysis.

Always wear gloves! The SEM is extremely sensitive to contamination. Gloves must be worn when touching your sample, sample holder, placing the sample holder into the instrument chamber, or cleaning the chamber seal.

Resolution at any magnification, the beam size must be reasonably well-matched to the size of the pixel – otherwise a loss in sharpness or production of artefacts of the image results due to oversampling or under-sampling. Beam current is proportional to the probe diameter. The probe diameter must be smaller than the size of the features to imaged.